Control Chart Type Selection Guide
Choosing the wrong control chart is the most common reason SPC fails: limits are too wide, too tight or just meaningless. This guide maps your data type and subgroup size to the correct chart and shows how each chart's limits are calculated.
| Chart | Data type | Subgroup | Center line and limits | Use when |
|---|---|---|---|---|
X-bar and R | Variable (measured) | 2 to 10, constant | UCL = Xbarbar + A2*Rbar; LCL = Xbarbar - A2*Rbar; R chart UCL = D4*Rbar, LCL = D3*Rbar | Rational subgroups of 2 to 9 parts taken close together, such as 5 consecutive parts per hour |
X-bar and S | Variable (measured) | 10 or more, or varying | UCL = Xbarbar + A3*Sbar; S chart UCL = B4*Sbar, LCL = B3*Sbar | Larger subgroups where the range loses efficiency, or automated gauging |
Individuals and moving range (I-MR) | Variable (measured) | 1 | UCL = Xbar + 2.66*MRbar; MR UCL = 3.267*MRbar, MR LCL = 0 | One reading per batch, per day or per lot; slow processes, chemical batches, monthly costs |
Median and R | Variable (measured) | Small, odd, 3 to 5 | Median limits use the average median and Rbar with their own constants | Operators plot by hand and want to avoid arithmetic |
p chart | Attribute: fraction defective | Variable n allowed | pbar +/- 3*sqrt(pbar*(1 - pbar)/n) | Count of nonconforming units per lot or per day, where the sample size changes |
np chart | Attribute: count defective | Constant n | npbar +/- 3*sqrt(npbar*(1 - pbar)) | Same as p chart but with a constant sample size and counts easier to read |
c chart | Attribute: defects count | Constant area of opportunity | cbar +/- 3*sqrt(cbar) | Defects per unit, such as blemishes per panel, where each inspected unit has equal area |
u chart | Attribute: defects per unit | Variable area allowed | ubar +/- 3*sqrt(ubar/n) | Defects per board, per meter or per square foot when the inspected amount varies |
Laney p prime and u prime | Attribute with overdispersion | Large, variable | Standard p or u limits scaled by a within-process sigma estimate from moving ranges of z scores | Large subgroups where standard p or u limits flag nearly every point |
EWMA | Variable or attribute | 1 or more | Weighted average with lambda about 0.05 to 0.25; limits about L = 2.7 to 3 times sigma times sqrt(lambda/(2 - lambda)) | Detecting small sustained shifts of about 0.5 to 1.5 sigma faster than a Shewhart chart |
CUSUM | Variable | 1 or more | Accumulates deviations from target; common design k = 0.5 sigma, decision interval h = 4 to 5 sigma | Detecting small persistent shifts, tracking tool wear or drift against a target |
Z-MR or short-run chart | Variable | 1 | Plot (x - target)/sigma for each part number; apply I-MR limits to the standardized values | High-mix job shops where each part number has a few readings |
Three-way (between and within) | Variable | 2 or more | I-MR on subgroup means plus a range or S chart for within-subgroup variation | Processes with real between-subgroup variation, for example batch-to-batch plus within-batch |
Hotelling T squared | Variable, several correlated | 1 or more | UCL from the F distribution on the multivariate distance from the mean vector | Several correlated characteristics monitored together, such as length and diameter from the same cut |
Run chart | Any | 1 | Median line only, no control limits | Early look at a new process before enough data exist for control limits |
Pareto chart | Categorical counts | Not applicable | Not a control chart; ranks causes by frequency or cost | Choosing which defect category to attack first, not monitoring stability |
Constants A2, A3, D3, D4, B3, B4 and d2 depend on subgroup size; look them up in any SPC table. Always confirm that the subgroup is rational: variation inside it should reflect common causes only.
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How to use the guide
Start with the data type. If you measure a dimension, weight or temperature it is variable data; if you count defects or defective units it is attribute data. Then look at the subgroup: how many readings you take at each sampling point. Search the table for variable, attribute, small shift or short run and read the Use when column. Export the list to Excel to paste into a control plan template so every characteristic names its chart type.
- Variable data with subgroups of 2 to 9: X-bar and R
- Variable data, one reading per point: individuals and moving range
- Defectives (units): p or np. Defects (counts): c or u
The logic of each family
Shewhart charts set limits at three standard errors from the center line. For variable data, the standard error is estimated from the within-subgroup range or standard deviation, which is why rational subgrouping matters so much. For attribute data, the binomial model drives p and np charts and the Poisson model drives c and u charts. EWMA and CUSUM are not replacements but complements: they remember previous points and respond to small shifts that a Shewhart chart takes many points to notice.
Worked example
An injection molding cell measures one shot weight every 15 minutes: that is individuals data, so use I-MR. If the cell instead pulls five consecutive shots every hour, use X-bar and R with n = 5, where A2 = 0.577, D3 = 0 and D4 = 2.114. If the inspector counts rejected parts per lot with lot sizes varying from 200 to 800, use a p chart because the sample size changes, and the limits will move with each lot.
Common mistakes
Teams often use X-bar and R with subgroups that mix machines or shifts, which inflates the within-subgroup variation and hides real signals. Others use a c chart when the inspected area varies, where a u chart is correct. Using specification limits as control limits is another classic error: control limits describe the voice of the process, specs describe the voice of the customer.
- Do not mix streams in one subgroup
- Use u instead of c when the area of opportunity changes
- Never draw spec limits on an X-bar chart as if they were control limits
Frequently Asked Questions
What is the difference between a defect and a defective?
A defect is a single nonconformity, and one unit can have several. A defective is a unit with at least one defect. Count defectives with p or np charts, and count defects with c or u charts.
When should I use EWMA instead of X-bar?
Use EWMA when the process is stable and you care about small shifts, roughly half to one and a half standard deviations, that matter commercially. Keep a Shewhart chart alongside it for large shifts, since EWMA reacts more slowly to them.
Can I use a control chart with non-normal data?
Shewhart charts for subgroup means are fairly robust because of the central limit theorem. Individuals charts are less robust. For skewed data consider a transformation, a chart based on the right distribution, or a time-between-events chart.
How many points do I need to set limits?
A common guideline is at least 20 to 25 subgroups collected while the process runs normally. Fewer points give unreliable limits, so treat them as trial limits and review once you have more data.
If you want SPC charts generated straight from ERP or MES measurement tables instead of spreadsheets, Netray can scope that with you.
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